Burnett, T; Yakimova, R*; Kazakova, O (2011) Mapping of local electrical properties in epitaxial graphene using electrostatic force microscopy. NanoLetters, 11 (6). pp. 2324-2330.
Full text not available from this repository.Abstract
Local electrical characterization of epitaxial graphene grown on 4H-SiC(0001) using Electrostatic Force Microscopy (EFM) in ambient conditions and at elevated temperatures is presented. EFM provides a straightforward identification of graphene with different numbers of layers on the substrate where topographical determination is hindered by adsorbates. Novel EFM spectroscopy has been developed measuring the EFM phase as a function of the electrical DC bias, establishing a rigorous way to distinguish graphene domains and facilitating optimization of EFM imaging.
Item Type: | Article |
---|---|
Keywords: | epitaxial graphene, Electrostatic Force Microscopy, phase contrast, surface potential |
Subjects: | Nanoscience Nanoscience > Surface and Nanoanalysis |
Identification number/DOI: | 10.1021/nl200581g |
Last Modified: | 02 Feb 2018 13:14 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/5008 |
Actions (login required)
![]() |
View Item |