< back to main site

Publications

Mapping of local electrical properties in epitaxial graphene using electrostatic force microscopy.

Burnett, T; Yakimova, R*; Kazakova, O (2011) Mapping of local electrical properties in epitaxial graphene using electrostatic force microscopy. NanoLetters, 11 (6). pp. 2324-2330.

Full text not available from this repository.

Abstract

Local electrical characterization of epitaxial graphene grown on 4H-SiC(0001) using Electrostatic Force Microscopy (EFM) in ambient conditions and at elevated temperatures is presented. EFM provides a straightforward identification of graphene with different numbers of layers on the substrate where topographical determination is hindered by adsorbates. Novel EFM spectroscopy has been developed measuring the EFM phase as a function of the electrical DC bias, establishing a rigorous way to distinguish graphene domains and facilitating optimization of EFM imaging.

Item Type: Article
Keywords: epitaxial graphene, Electrostatic Force Microscopy, phase contrast, surface potential
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Identification number/DOI: 10.1021/nl200581g
Last Modified: 02 Feb 2018 13:14
URI: http://eprintspublications.npl.co.uk/id/eprint/5008

Actions (login required)

View Item View Item