Burnett, T; Yakimova, R*; Kazakova, O (2011) Mapping of local electrical properties in epitaxial graphene using electrostatic force microscopy. NanoLetters, 11 (6). pp. 2324-2330.

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Abstract

Local electrical characterization of epitaxial graphene grown on 4H-SiC(0001) using Electrostatic Force Microscopy (EFM) in ambient conditions and at elevated temperatures is presented. EFM provides a straightforward identification of graphene with different numbers of layers on the substrate where topographical determination is hindered by adsorbates. Novel EFM spectroscopy has been developed measuring the EFM phase as a function of the electrical DC bias, establishing a rigorous way to distinguish graphene domains and facilitating optimization of EFM imaging.

Item Type:	Article
Keywords:	epitaxial graphene, Electrostatic Force Microscopy, phase contrast, surface potential
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Identification number/DOI:	10.1021/nl200581g
Last Modified:	02 Feb 2018 13:14
URI:	http://eprintspublications.npl.co.uk/id/eprint/5008

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