Mingard, K P; Day, A*; Maurice, C*; Quested, P N (2011) Towards high accuracy calibration of electron backscatter diffraction systems. Ultramicroscopy, 111 (5). pp. 320-329.

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Abstract

For precise orientation and strain measurements, advanced Electron Backscatter Diffraction (EBSD) techniques require both accurate calibration and reproducible measurement of the system geometry. In many cases the pattern centre (PC) needs to be determined to sub-pixel accuracy. The mechanical insertion / retraction, through the Scanning Electron Microscope (SEM) chamber wall, of the electron sensitive part of modern EBSD detectors also causes alignment and positioning problems and requires frequent monitoring of the PC. Optical alignment and lens distortion issues within the scintillator, lens and CCD camera combination of an EBSD detector need accurate measurement for each individual EBSD system.
This paper highlights and quantifies these issues and presents a novel shadow-casting technique to determine the absolute PC to ~10 microns precision or ~1/3 CCD pixel.

Item Type:	Article
Keywords:	EBSD, SEM, Pattern Centre, Calibration
Subjects:	Advanced Materials Advanced Materials > Microstructural Characterisation
Identification number/DOI:	10.1016/j.ultramic.2011.01.012
Last Modified:	02 Feb 2018 13:14
URI:	http://eprintspublications.npl.co.uk/id/eprint/4964

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