Wain, A J; Cox, D; Zhou, S; Turnbull, A (2011) High aspect ratio needle probes for combined scanning electrochemical microscopy - Atomic Force Microscopy. Electrochem. Commun., 13 (1). pp. 78-81.

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Abstract

The development and characterisation of high-aspect ratio needle probes for combined scanning electrochemical microscopy -atomic force microscopy (SECM-AFM) is described. Commercially available coated metallic needle probes have been modified by a simple procedure to yield probes with an addressable nano-disk electrode integrated into the tip apex. The probes behaved well electrochemically, with a typical electrochemical radius of approximately 140 nm and the preliminary application of these probes to high resolution topographical and electrochemical imaging was demonstrated.

Item Type:	Article
Keywords:	SECM, AFM, Combined SECM-AFM, Needle Probes, Focused Ion Beam
Subjects:	Advanced Materials Advanced Materials > Electrochemistry
Identification number/DOI:	10.1016/j.elecom.2010.11.018
Last Modified:	02 Feb 2018 13:14
URI:	http://eprintspublications.npl.co.uk/id/eprint/4852

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