Maurice, C*; Fortunier, R*; Driver, J*; Day, A*; Mingard, K P; Meaden, G* (2010) Comments on the paper "Bragg's Law diffraction simulations for electron backscatter diffraction analysis". Ultramicroscopy, 110 (7). pp. 758-759.

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Abstract

Letter to the Editor of Ultramicroscopy on a paper submitted by Kacher et al. The methodology introduced by Kacher et al. involves the use of a simulated pattern as the "reference" EBSP for comparison with experimental EBSPs in a strained material. An iterative procedure is applied to minimize the distortion between the experimental pattern and a simulated pattern with an applied displacement gradient tensor, which is hoped to adequately reflect the strain state of the experimental pattern.
However, from experience [4] of cross-correlation between simulated and experimental patterns, this approach suffers from irremediable pitfalls. The main problem being the inherently poor accuracy in determining the source position - particularly the Pattern Centre (PC) as it appears on the EBSD phosphor [5], and the detector distance (DD). This letter presents a brief account of the limitations of the method proposed by Kacher et al

Item Type:	Article
Keywords:	EBSD, Strain measurement
Subjects:	Advanced Materials Advanced Materials > Microstructural Characterisation
Last Modified:	02 Feb 2018 13:15
URI:	http://eprintspublications.npl.co.uk/id/eprint/4729

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