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Experimental methods for the calibration of lateral forces in atomic force microscopy.

Munz, M (2010) Experimental methods for the calibration of lateral forces in atomic force microscopy. In: Scanning Probe Microscopy in Nanoscience and Nanotechnology. Springer, pp. 259-321.

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As a variation of atomic/scanning force microscopy (AFM/SFM), lateral force microscopy (LFM) relies on the torsional deformation of the AFM cantilever upon lateral forces acting between tip and sample surface. LFM enables imaging of frictional properties of the surfaces of materials, thin films or monolayers at a high spatial resolution. Furthermore, LFM is increasingly used to study the effect of shear loading on nanostructures or nanoparticulates. Albeit a large variety of applications have been demonstrated and the measurement mode is implemented in most commercially available AFM instruments, LFM seems to suffer from a lack of reliable and established calibration methods for lateral forces. However, general acceptance of LFM requires quantification coupled with a solid understanding of the sources of uncertainty. This chapter reviews the available experimental calibration methods. In addition to a description of these methods, a table including information on the key characteristics is provided as well as an overview of the basic equations.

Item Type: Book Chapter/Section
Keywords: lateral force microscopy (LFM), friction force microscopy (FFM), atomic force microscopy (AFM), scanning probe microscopy (SPM), torsional spring constant / stiffness, lateral spring constant / stiffness, sensitivity, crosstalk, friction loop, resonance
Subjects: Nanoscience
Nanoscience > Surface and Nanoanalysis
Publisher: Springer
Last Modified: 02 Feb 2018 13:15
URI: http://eprintspublications.npl.co.uk/id/eprint/4647

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