Naftaly, M; Dudley, R A; Fletcher, J R* (2010) An etalon-based method for frequency calibration of terahertz time-domain spectrometers (THz TDS). Opt. Commun., 283 (9). pp. 1849-1853.
Full text not available from this repository.Abstract
We present an etalon-based method of calibrating the frequency of terahertz time-domain spectrometers (THz TDS). The method utilizes the etalon effect produced by multiple reflections in non-absorbing wafers or in narrow air-gaps. The technique provides frequency calibration across the measurement bandwidth with uncertainties comparable with the typical THz TDS resolution.
Item Type: | Article |
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Keywords: | terahertz, frequency calibration |
Subjects: | Electromagnetics Electromagnetics > Terahertz |
Last Modified: | 02 Feb 2018 13:15 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/4610 |
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