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Improving single-crystal orientation determination for advanced nickel-based alloys.

Clay, K*; Jackson, J D*; Quested, P N; Morrell, R (2009) Improving single-crystal orientation determination for advanced nickel-based alloys. Measurement Good Practice Guide. 112

Text (Measurement Good Practice Guide No 112)
MGPG 112.pdf - Published Version

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This Good Practice Guide describes the determination of single-crystal orientation measurements for single-crystal nickel-base castings by back and side-reflection X-ray diffraction (Laue). These measurements check the quality of the castings against specifications set by the OEMs for the foundries.
For quality control three parameters are determined:
1. The angle between a reference direction in the component, defining the preferred direction of solidification, and the closest <100> direction. (q).
2. Less commonly, the angle between a second reference direction in the plane perpendicular to the original reference direction (a) and/or a <001> direction (k).
3. For single crystals with more than one grain a measurement of the misorientation or disorientation between adjacent grains (R).
The guide contains information about the definition of orientation parameters; principles of back-reflection and side-reflection Laue systems; calibration standards; system alignment; calibration; validation and uncertainty of measurements with a final section on making the measurements.
The definition of primary angles is based upon European practice but a comparison with two definition conventions used in the USA is included.

Item Type: Report/Guide (Measurement Good Practice Guide)
Keywords: Single crystals, X-rays, Laue patterns
Subjects: Advanced Materials
Advanced Materials > Microstructural Characterisation
Last Modified: 19 Dec 2019 14:15
URI: http://eprintspublications.npl.co.uk/id/eprint/4548

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