Williams, J M; Smith, D R*; Georgakopoulos, D*; Patel, P D*; Pickering, J R* (2009) Design and metrological applications of a low noise, high electrical isolation measurement unit. IET Proc. Sci. Meas. Technol., 3 (2). pp. 165-174.
Full text not available from this repository.Abstract
A digitally-controlled voltage generation and measurement unit optimised for high precision electrical metrology is described. It is optically isolated from the controlling computer and contains specially constructed isolated power supplies allowing continuous operation without the need to re-charge batteries. The source has a simple microcontroller which is pre-programmed with firmware to control operation and to carry out simple repetitive measurement tasks such as generation and quantization of signals using uniform sampling. The merits of the developed unit are demonstrated by three example applications: (i) the application of the unit to DC voltage measurements conducted at the top of the traceability chain, (ii) the implementation of a transfer standard for the calibration of the electronic instrumentation of fatigue testing machines traceable to the primary electrical standards and (iii) the force measurement of an ion thruster traceable to the primary electrical standards at the industrial user level.
Item Type: | Article |
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Keywords: | Electrical metrology, data acquisition, current source, low pass filter, cryogenic current comparator, Josephson junction bias source, strain gauge simulator |
Subjects: | Electromagnetics Electromagnetics > Electrical Quantum Standards |
Last Modified: | 02 Feb 2018 13:15 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/4387 |
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