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Infrared metrology for spintronic materials and devices.

Vopsaroiu, M; Stanton, T*; Thomas, O; Cain, M G; Thompson, S M* (2009) Infrared metrology for spintronic materials and devices. Meas. Sci. Technol., 20 (4). 045109

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Magneto-resistance is the most important characteristic of spintronic magneto-resistive materials. This is usually measured using some form of electrical contact probe testing. In this paper we discuss a simple optical IR experiment that allows the non-contact measurement of the magneto-resistance of spintronic materials and devices. The results have been compared with the electrical GMR curves showing a good agreement. The ability to measure a GMR profile using a non-contact, non-destructive infrared technique has important implications, enabling in-situ sample testing, non-contact profiling of the GMR at wafer level and spatial resolution GMR measurements.

Item Type: Article
Subjects: Electromagnetics
Electromagnetics > Electromagnetic Materials
Last Modified: 02 Feb 2018 13:15
URI: http://eprintspublications.npl.co.uk/id/eprint/4343

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