< back to main site

Publications

Measurement and noise performance of nano-superconducting-quantum-interference devices fabricated by focused ion beam.

Hao, L; Macfarlane, J C; Gallop, J C; Cox, D; Beyer, J*; Drung, D*; Schurig, T* (2008) Measurement and noise performance of nano-superconducting-quantum-interference devices fabricated by focused ion beam. Appl. Phys. Lett., 92 (19). 192507

Full text not available from this repository.

Abstract

Scientific and industrial measurement are demanding ever more sensitive measurements on ever smaller systems, as exemplified by requirements of spintronics, NEMS and spin-based QIP, where single electronic spin detection poses a grand challenge. SQUIDs provide the most sensitive measurement devices for a wide range of physical parameters but have yet to be effectively applied to nanoscale measurements. Here we show that a single-layer deposition route, combining photolithography with focussed ion beam (FIB) and electron beam methods produces nanoscale SQUIDs achieving some of the lowest noise values, exhibiting this exceptional performance at temperatures two orders higher than any comparable device.

Item Type: Article
Keywords: NanoSQUIDs, FIB, Spin detection
Subjects: Quantum Phenomena
Quantum Phenomena > Nanophysics
Last Modified: 02 Feb 2018 13:15
URI: http://eprintspublications.npl.co.uk/id/eprint/4218

Actions (login required)

View Item View Item