Seah, M P; Gilmore, I S; Spencer, S J (2001) Quantitative AES IX and quantitative XPS II: Auger and X-ray photoelectron intensities from elemental spectra in digital databases reanalysed with a REELS database. Surf. Interface Anal., 31. pp. 778-795.
Full text not available from this repository.Abstract
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| Item Type: | Article |
|---|---|
| Subjects: | Nanoscience |
| Last Modified: | 02 Feb 2018 13:17 |
| URI: | https://eprintspublications.npl.co.uk/id/eprint/4109 |
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