Seah, M P; Spencer, S J; Bodino, F*; Pireaux, J J* (1997) The alignment of spectrometers and quantitative measurements in X-ray photoelectron spectroscopy. J. Electron Spectrosc., 87. pp. 159-167.
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| Item Type: | Article |
|---|---|
| Subjects: | Nanoscience Nanoscience > Surface and Nanoanalysis |
| Last Modified: | 02 Feb 2018 13:18 |
| URI: | https://eprintspublications.npl.co.uk/id/eprint/4015 |
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