Seah, M P; De Chiffre, L* (2006) Surface and interface characterisation. In: Springer handbook of materials measurement methods. Springer, pp. 229-280.

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Item Type:	Book Chapter/Section
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Publisher:	Springer
Last Modified:	02 Feb 2018 13:16
URI:	https://eprintspublications.npl.co.uk/id/eprint/4010