Seah, M P (2006) Recent advances to establish XPS as an accurate metrology tool. J. Surf. Anal., 13. pp. 136-141.

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Item Type:	Article
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Last Modified:	02 Feb 2018 13:16
URI:	https://eprintspublications.npl.co.uk/id/eprint/4009