Cumpson, P J; Seah, M P (1997) Elastic scattering corrections in AES and XPS: II. Estimating attenuation lengths and conditions required for their valid use in overlayer/substrate experiments. Surf. Interface Anal., 25. pp. 430-446.

Full text not available from this repository.

Abstract

No abstract available

Item Type:	Article
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Last Modified:	02 Feb 2018 13:18
URI:	https://eprintspublications.npl.co.uk/id/eprint/4002