Clifford, C A; Seah, M P (2006) Modelling of nanomechanical nanoindentation measurements using an AFM or nanoindenter for compliant layers on stiffer substrates. Nanotechnology, 17. pp. 5283-5292.
Full text not available from this repository.Abstract
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| Item Type: | Article |
|---|---|
| Subjects: | Nanoscience Nanoscience > Surface and Nanoanalysis |
| Last Modified: | 02 Feb 2018 13:16 |
| URI: | https://eprintspublications.npl.co.uk/id/eprint/4001 |
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