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Failure analysis of high temperature superconducting films at high microwave power using microsecond time domain measurements.

Purnell, A J*; Cohen, L F*; Hao, L; Gallop, J C (2005) Failure analysis of high temperature superconducting films at high microwave power using microsecond time domain measurements. Appl. Phys. Lett., 86. 092506

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Abstract

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Item Type: Article
Subjects: Quantum Phenomena
Last Modified: 02 Feb 2018 13:16
URI: http://eprintspublications.npl.co.uk/id/eprint/3746

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