Arnaut, L R (2005) Correcting for imperfections in the experimental characterization of dielectric media for high-precision metrology. In: 3rd International Conference on Materials for Advanced Technologies (ICMAT), 3-9 July 2005, Singapore.
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Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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Subjects: | Electromagnetics Electromagnetics > Electromagnetic Materials |
Last Modified: | 02 Feb 2018 13:16 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/3717 |
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