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Correcting for imperfections in the experimental characterization of dielectric media for high-precision metrology.

Arnaut, L R (2005) Correcting for imperfections in the experimental characterization of dielectric media for high-precision metrology. In: 3rd International Conference on Materials for Advanced Technologies (ICMAT), 3-9 July 2005, Singapore.

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Abstract

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: Electromagnetics
Electromagnetics > Electromagnetic Materials
Last Modified: 02 Feb 2018 13:16
URI: http://eprintspublications.npl.co.uk/id/eprint/3717

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