Tomlins, P H; Wang, R K* (2006) Simultaneous analysis of refractive index and physical thickness by Fourier domain optical coherence tomography. IEE Proc., Optoelectron., 153 (5). pp. 222-228.

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Item Type:	Article
Subjects:	Optical Radiation and Photonics
Last Modified:	02 Feb 2018 13:16
URI:	https://eprintspublications.npl.co.uk/id/eprint/3700