Mingard, K P; Bennett, E G; Ive, A J; Roebuck, B (2006) Microstructure mapping in high temperature compression testpieces - grain size metrology by electron back scatter diffraction. NPL Report. DEPC-MN 037

Text DEPC_MN37.pdf Download (1MB)

Abstract

No abstract available

Item Type:	Report/Guide (NPL Report)
NPL Report No.:	DEPC-MN 037
Keywords:	EBSD, hot deformation
Subjects:	Advanced Materials Advanced Materials > Microstructural Characterisation
Last Modified:	02 Feb 2018 13:16
URI:	http://eprintspublications.npl.co.uk/id/eprint/3466

Actions (login required)

View Item