Dura, J A*; Seah, M P (2004) Advances in measurement: neutron reflectometry for highly accurate nanometer metrology.

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Item Type:	Article
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Last Modified:	02 Feb 2018 13:16
URI:	https://eprintspublications.npl.co.uk/id/eprint/3391