Cumpson, P J; Hedley, J*; Clifford, C A (2005) Microelectromechanical device for lateral force calibration in the atomic force microscope: lateral electrical nanobalance. J. Vac. Sci. Technol. B, 23 (5). pp. 1992-1997.

Full text not available from this repository.

Abstract

No abstract available

Item Type:	Article
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Last Modified:	02 Feb 2018 13:16
URI:	https://eprintspublications.npl.co.uk/id/eprint/3385