Hall, M J (2005) Characterization of magnetic force microscope probes for quantitative magnetic field mapping at micron length scales. In: BEMC 2005 - British Electromagnetic Measurements Conference, 14-17 November 2005, NPL, UK.

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Abstract

Magnetic Force Microscopy is used to image magnetic features at micron length scales in many situations. For the image contrast to be quantitative the tip of the scanning probe needs to be characterised. Methods for achieving this are being developed and will be presented.

Item Type:	Conference or Workshop Item (UNSPECIFIED)
Subjects:	Nanoscience
Last Modified:	02 Feb 2018 13:16
URI:	http://eprintspublications.npl.co.uk/id/eprint/3320

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