Sheridan, B; Cumpson, P J; Bailey, M J A (2005) Metrology at the nano scale. Phys. World, 18 (8). pp. 37-40.

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Item Type:	Article
Subjects:	Nanoscience
Last Modified:	02 Feb 2018 13:16
URI:	https://eprintspublications.npl.co.uk/id/eprint/3246