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The NPL correction kit for enhanced and traceable reflectance measurement.

Clarke, P J (2003) The NPL correction kit for enhanced and traceable reflectance measurement. Proc. SPIE - Int. Soc. Opt. Eng., 4826. pp. 123-128.

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Abstract

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Item Type: Article
Subjects: Optical Radiation and Photonics
Optical Radiation and Photonics > Materials and Appearance
Last Modified: 02 Feb 2018 13:16
URI: http://eprintspublications.npl.co.uk/id/eprint/2959

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