Broughton, W R; Fry, A T; Mendels, D A; Chunnilall, C J (2003) Near surface strain measurements on quartz wafers and devices. NPL Report. MATC(MN)52

Text MATC_MN52.pdf Download (295kB)

Abstract

No abstract available

Item Type:	Report/Guide (NPL Report)
NPL Report No.:	MATC(MN)52
Keywords:	electronic speckle pattern interferometry, Raman spectroscopy, x-ray diffraction
Subjects:	Advanced Materials
Last Modified:	02 Feb 2018 13:16
URI:	http://eprintspublications.npl.co.uk/id/eprint/2747

Actions (login required)

View Item