Gilmore, I S; Seah, M P (2003) Investigating the difficulty of eliminating flood gun damage in TOF-SIMS. Appl. Surf. Sci., 203-20. pp. 600-604.

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Abstract

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Item Type:	Article
Keywords:	static SIMS, electron damage, gentle SIMS, fragmentation
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Last Modified:	02 Feb 2018 13:16
URI:	https://eprintspublications.npl.co.uk/id/eprint/2700