Fry, A T (2002) Residual stress measurement: XRD depth profiling using successive material removal. NPL Report. MATC(MN)34
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Abstract
As part of a continuing effort to improve and refine residual stress measurement using XRD technique, NPL has recently completed a series of measurements on a nickel based superalloy, which had been homogeneously shot-peened. The purpose of these measurements was to investigate and illustrate how progressive material removal can significantly relax the stresses generated by peening.
Item Type: | Report/Guide (NPL Report) |
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NPL Report No.: | MATC(MN)34 |
Keywords: | electrolytic polishing, neutron diffraction |
Subjects: | Advanced Materials Advanced Materials > Surface Engineering Advanced Materials > Mechanical Measurement |
Last Modified: | 02 Feb 2018 13:17 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/2494 |
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