Fry, A T (2002) Residual stress measurement: XRD depth profiling using successive material removal. NPL Report. MATC(MN)34

Text MATC_MN34.pdf Download (309kB)

Abstract

As part of a continuing effort to improve and refine residual stress measurement using XRD technique, NPL has recently completed a series of measurements on a nickel based superalloy, which had been homogeneously shot-peened. The purpose of these measurements was to investigate and illustrate how progressive material removal can significantly relax the stresses generated by peening.

Item Type:	Report/Guide (NPL Report)
NPL Report No.:	MATC(MN)34
Keywords:	electrolytic polishing, neutron diffraction
Subjects:	Advanced Materials Advanced Materials > Surface Engineering Advanced Materials > Mechanical Measurement
Last Modified:	02 Feb 2018 13:17
URI:	http://eprintspublications.npl.co.uk/id/eprint/2494

Actions (login required)

View Item