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Residual stress measurement: XRD depth profiling using successive material removal.

Fry, A T (2002) Residual stress measurement: XRD depth profiling using successive material removal. NPL Report. MATC(MN)34

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Abstract

As part of a continuing effort to improve and refine residual stress measurement using XRD technique, NPL has recently completed a series of measurements on a nickel based superalloy, which had been homogeneously shot-peened. The purpose of these measurements was to investigate and illustrate how progressive material removal can significantly relax the stresses generated by peening.

Item Type: Report/Guide (NPL Report)
NPL Report No.: MATC(MN)34
Keywords: electrolytic polishing, neutron diffraction
Subjects: Advanced Materials
Advanced Materials > Surface Engineering
Advanced Materials > Mechanical Measurement
Last Modified: 02 Feb 2018 13:17
URI: http://eprintspublications.npl.co.uk/id/eprint/2494

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