Milton, M J T; Cumpson, P J (2002) Nanoscale and integrity of the SI. In: IEEE Conference on Precision Electromagnetic Measurements Conference Digest, June 2002.

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Abstract

Traceable measurements at the nano-scale are usually made by establishing links to the scale of the SI base units all of which are defined at the macro-scale. We report the results of a study into the implications of the burgeoning developments in nano-technology on the realisation of S.I. quantities at the nano-scale.

Item Type:	Conference or Workshop Item (UNSPECIFIED)
Subjects:	Nanoscience
Last Modified:	02 Feb 2018 13:17
URI:	https://eprintspublications.npl.co.uk/id/eprint/2430