Bennett, E G (1994) Interference film microscopy for materials characterisation and measurement. Proceedings RMS, 29 (5). pp. 311-313.

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Item Type:	Article
Subjects:	Advanced Materials Advanced Materials > Microstructural Characterisation
Last Modified:	02 Feb 2018 13:19
URI:	http://eprintspublications.npl.co.uk/id/eprint/2426

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