Fitzpatrick, M E*; Fry, A T; Holdway, P*; Kandil, F A; Shackleton, J*; Suominen, L (2005) Determination of residual stresses by X-ray diffraction. Measurement Good Practice Guide. 52

Text (Measurement Good Practice Guide No. 52) mgpg52.pdf - Published Version Download (1MB)

Abstract

This guide is applicable to X-ray stress measurements on crystalline materials. There is currently no published standard for the measurement of residual stress by XRD. This guide has been developed therefore as a source of information and advice on the technique. It is based on results from two UK intercomparison exercises, detailed parameter investigations and discussions and input from XRD experts. The information is presented in separate sections which discuss the fundamental background of X-ray diffraction techniques, the different types of equipment that can be used, practical issues relating to the specimen, the measurement procedure itself and recommendation on how and what to record and report. The appendices provide further information on uncertainty evaluation and some recommendations regarding the data analysis techniques that are available. Where appropriate key points are highlighted in the text and summarised at the end of the document.

Item Type:	Report/Guide (Measurement Good Practice Guide)
Notes:	NPL made every effort to ensure all information contained in this Good Practice Guide was correct at time of publication. NPL is not responsible for any errors, omissions or obsolescence, and does not accept any liability arising from the use of these Good Practice Guides.
Keywords:	X-ray diffraction, residual stress, measurement, crystalline, peak shift
Subjects:	Advanced Materials Advanced Materials > Mechanical Measurement
Last Modified:	23 Feb 2026 09:24
URI:	https://eprintspublications.npl.co.uk/id/eprint/2391