Leach, R K; Haycocks, J; Jackson, K; Lewis, A; Oldfield, S; Yacoot, A (2000) Advances in traceable nanometrology at the National Physical Laboratory. In: Proc. Int. Seminar Future Directions of Nanotechnology in Europe and Japan., 18-19 September 2000, Warwick University.

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Item Type:	Conference or Workshop Item (UNSPECIFIED)
Subjects:	Nanoscience Nanoscience > Nano-Dimensional
Last Modified:	02 Feb 2018 13:17
URI:	https://eprintspublications.npl.co.uk/id/eprint/1784