Cumpson, P J (1995) Angle-resolved XPS and AES: depth resolution limits and a general comparison of properties of depth profile reconstruction methods. J. Electron Spectrosc. Relat. Phenom., 73 (1). 25 - 52

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Item Type:	Article
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Last Modified:	02 Feb 2018 13:19
URI:	https://eprintspublications.npl.co.uk/id/eprint/122