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Characterization of an open resonator with low-permittivity thin films utilizing a frequency-comb locked continuous-wave terahertz spectrometer

Mueller, S; Puppe, T; Gregory, A; Kutz, J; Vieweg, N; Naftaly, M (2025) Characterization of an open resonator with low-permittivity thin films utilizing a frequency-comb locked continuous-wave terahertz spectrometer. In: 2025 50th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 17-22 August 2025, Helsinki, Finland.

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Abstract

In this work we demonstrate an open resonator powered for the first time by a frequency-comb locked continuous wave terahertz spectrometer. A sample of a 10 μm thin cling film is placed into the resonator, leading to shifts and attenuation of resonance frequencies, and proving the sensitivity of our instrument to low-absorbing, low-permittivity materials.

Item Type: Conference or Workshop Item (Paper)
Subjects: Optical Radiation and Photonics > Materials and Appearance
Divisions: Electromagnetic & Electrochemical Technologies
Publisher: IEEE
Identification number/DOI: 10.1109/IRMMW-THz61557.2025.11319850
Last Modified: 23 Mar 2026 13:54
URI: https://eprintspublications.npl.co.uk/id/eprint/10342
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