Barwood, G P; Gill, P; Rowley, W R C (1998) High accuracy length metrology using multiple-stage swept-frequency interferometry with laser diodes. Meas. Sci. Technol., 9 (7). pp. 1036-41.
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Item Type: | Article |
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Subjects: | Time and Frequency Time and Frequency > Optical Frequency Standards and Metrology |
Last Modified: | 02 Feb 2018 13:18 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/1011 |
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