Stanley, M; Shang, X; Celep, M; Salter, M; de Graaf, S; Lindstrom, T; Shin, S-H; Skinner, J; Singh, D; Stokes, D; Acharya, M; Ridler, N M (2024) RF and Microwave Metrology for Quantum Computing – Recent Developments at the UK’s National Physical Laboratory. International Journal of Microwave and Wireless Technologies, 16 (4). pp. 535-543.

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Abstract

Development of large-scale quantum computing systems will require RF and microwave technologies operating reliably at cryogenic temperatures down to tens of milli-kelvin (mK). The quantum bits in the most promising quantum computing technologies such as the superconducting quantum computing are designed using principles of microwave engineering and operated using microwave signals. The control, readout and coupling of qubits are implemented using a network of microwave components operating at various temperature stages. To ensure reliable operation of quantum computing systems, it is critical to ensure optimal performance of these microwave components and qubits at their respective operating temperatures which can be as low as mK temperatures. It is, therefore, critical to understand the microwave characteristics of waveforms, components, circuits, networks, and systems at cryogenic temperatures.
The UK’s National Physical Laboratory (NPL) is focussed on developing new microwave measurement capabilities through the UK’s National Quantum Technologies programme to address various microwave test and measurement challenges in quantum computing. This includes the development of various measurement capabilities to characterise the microwave performance of quantum and microwave devices and substrate materials at cryogenic temperatures. This paper summarises the roadmap of activities at NPL to address these microwave metrology challenges in quantum computing.

Item Type:	Article
Keywords:	cryogenics, dilution refrigerator, microwave calibration, microwave metrology, probe station, quantum computing, s-parameter
Subjects:	Electromagnetics > RF and Microwave
Divisions:	Electromagnetic & Electrochemical Technologies
Identification number/DOI:	10.1017/S1759078724000369
Last Modified:	26 Feb 2025 10:44
URI:	https://eprintspublications.npl.co.uk/id/eprint/10022