Article

Spencer, B F; Church, S A; Thompson, P; Cant, D J H; Maniyarasu, S; Theodosiou, A; Jones, A N; Kappers, M J; Binks, D J; Oliver, R A; Higgins, J; Thomson, T; Shard, A G; Flavell, W R (2022) Characterization of buried interfaces using Ga Kα Hard X-ray Photoelectron Spectroscopy (HAXPES). Faraday Discussions, 236. pp. 311-337.