Report/Guide

Hughes, B; Forbes, A B; Sun, W J (2011) Good practice for deployment and use of iGPS/iSPACE: NIMTech deliverable 3.1(2). NPL Report. ENG 31

Hughes, B; Forbes, A B; Sun, W J (2011) Procedure for calibration of laser tracker alignment errors using a network measurement: NIMTech deliverable 3.1(1). NPL Report. ENG 29

Hughes, B; Forbes, A B; Nasr, K; Sun, W J; Veal, D (2011) Validation of the network method for determination of laser tracker alignment errors: NIMTech deliverable 3.7. NPL Report. ENG 30

Article

Jones, C W; Sun, W J; Boulter, H; Brown, S (2022) 3D roughness standard for performance verification of topography instruments for additively-manufactured surface inspection. Measurement Science and Technology, 33 (8). 084003

Sun, W J; Giusca, C; Lou, S; Yang, X Y; Chen, X; Fry, T; Jiang, X Q; Wilson, A; Brown, S; Boulter, H (2022) Establishment of X-ray computed tomography traceability for additively manufactured surface texture evaluation. Additive Manufacturing, 50. 102558

Sun, W J; Symes, D R; Brenner, C M; Bohnel, M; Brown, S; Mavrogordato, M N; Sinclair, I; Salmon, M (2022) Review of high energy x-ray computed tomography for non-destructive dimensional metrology of large metallic advanced manufactured components. Reports on Progress in Physics, 85 (1). 016102

Sun, W J; Claverley, J D (2015) Verification of an optical micro-CMM using the focus variation technique: aspects of probing errors. CIRP Ann. - Manuf. Technol., 64 (1). pp. 511-514.

Giusca, C L; Claverley, J D; Sun, W J; Leach, R K; Helmli, F*; Chavigner, M P J* (2014) Practical estimation of measurement noise and flatness deviation on focus variation microscopes. CIRP Ann. - Manuf. Technol., 63 (1). pp. 545-548.

Forbes, A B; Hughes, B; Sun, W J (2009) Comparison of measurements in co-ordinate metrology. Measurement, 42 (10). pp. 1473-1477.

Conference or Workshop Item

Shang, X B; Ridler, N M; Sun, W J; Cooper, P; Wilson, A (2019) Preliminary Study on WM-380 Waveguide TRL Calibration Line Standards at the UK's National Physical Laboratory. In: 2019 92nd ARFTG Microwave Measurement Conference (ARFTG), 19-22 January 2019, Orlando, Fl, USA.