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Kumar, N; Zoladek-Lemanczyk, A; Guilbert, A A Y*; Su, W T*; Tuladhar, S M*; Kirchartz, T*; Schroeder, B C*; McCulloch, I*; Nelson, J*; Roy, D; Castro, F A (2017) Simultaneous topographical, electrical and optical microscopy of optoelectronic devices at the nanoscale. Nanoscale, 9 (8). pp. 2723-2731.

Su, W T*; Kumar, N; Mignuzzi, S*; Crain, J; Roy, D (2016) Nanoscale mapping of excitonic processes in single-layer MoS2 using tip-enhanced photoluminescence microscopy. Nanoscale, 8 (20). pp. 10564-10569.

Su, W T*; Kumar, N; Dai, N*; Roy, D (2016) Nanoscale mapping of intrinsic defects in single-layer graphene using tip-enhanced Raman spectroscopy. Chem. Comms., 52 (53). pp. 8227-8230.

Su, W T*; Yang, L; Li, B* (2011) Optical properties and thermal stability of LaYbO3 ternary oxide for high-k dielectric application. Appl. Surf. Sci., 257 (7). pp. 2526-2530.