Paciello, V.; De Santis, L.; Hutzschenreuter, D.; Smith, I. (2020) A universal metadata model for metrological complex quantities. In: 2020 IEEE International Workshop on Metrology for Industry 4.0 & IOT (METROIND4.0&IOT), 3 - 5 June 2020, Roma, Italy.

Acko, B.; Weber, H.; Hutzschenreuter, D.; Smith, I. (2020) Communication and validation of metrological smart data in IoT-networks. Advances in Production Engineering & Management, 15 (1). pp. 107-117. ISSN 18546250