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Allal, D; Bannister, R; Buisman, K; Capriglione, D; Di Capua, G; Garcia-Patron, M; Gatzweiler, T; Gellersen, F; Harzheim, T; Heuermann, H; Hoffmann, J; Izbrodin, A; Kuhlmann, K; Lahbacha, K; Maffucci, A; Miele, G; Mubarak, F; Salter, M; Pham, T D; Sayegh, A; Singh, D; Stein, F; Zeier, M (2022) RF Measurements for Future Communication Applications: an Overview. In: 2022 IEEE International Symposium on Measurement & Networking (M&N), 18-20 July 2022, Padua, Italy.

Singh, D; Salter, M J; Johny, S; Ridler, N M (2022) Uncertainties in small-signal and large-signal measurements of RF amplifiers using a VNA. IEEE Instrumentation & Measurement Magazine, 25 (6). pp. 37-44.

Salter, M; Singh, D; Stant, L (2021) Nonlinear measurements for 5G devices and the associated uncertainties. In: Metrology for 5G and Emerging Wireless Technologies. IET, pp. 55-83. ISBN 9781839532788

Singh, D; Salter, M; Skinner, J; Ridler, N M (2021) Commissioning of a VNA dynamic uncertainty tool for microwave S-parameter measurements. NPL Report. TQE 16

Singh, D; Salter, M; Ridler, N M (2019) Comparison of Vector Network Analyser (VNA) calibration techniques at microwave frequencies. NPL Report. TQE 14

Singh, D; Salter, M; Ridler, N Characterisation of power transistors for wireless network applications using passive and active load-pull. In: 2024 IEEE International Symposium on Measurements & Networking (M&N), 02-05 July 2024, Rome, Italy.