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Items where Author is "Rumiantsev, A"
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Conference or Workshop Item
Ausden, L; Ridler, N N; Rumiantsev, A; Martens, J; Shang, X (2025) Comparison of Broadband Single-Sweep and Conventional Banded System On-Wafer S-Parameter Measurements up to 220 GHz. In: 2025 105th ARFTG Microwave Measurement Conference (ARFTG), 20 June 2025, San Fransisco, CA, USA.