Bu, T; Gao, H; Yao, Y; Wang, J; Pollard, A J; Legge, E J; Clifford, C A; Delvallee, A; Ducourtieux, S; Lawn, M A; Babic, B; Coleman, V A; Jamting, A; Zou, S; Chen, M; Jakubek, Z J; Iacob, E; Chanthawong, N; Mongkolsuttirat, K; Zeng, G; Almeida, C M; He, B-C; Hyde, L; Ren, L (2023) Thickness measurements of graphene oxide flakes using atomic force microscopy: Results of an international interlaboratory comparison. Nanotechnology, 34 (22). 225702

Turner, P; Paton, K R; Legge, E J; de Luna Bugallo, A; Rocha-Robledo, A K S; Zahab, A A; Centeno, A; Sacco, A; Pasquera, A; Zurutuza, A; Rossi, A M; Tran, D N H; Silva, D L; Losic, D; Farivar, F; Kerdoncuff, H; Kwan, H; Pirart, J; Campos, J L E; Subhedar, K M; Tay, L L; Ren, L; Cancado, L G; Paillet, M; Finnie, P; Yap, P L; Arenal, R; Dhakate, S R; Wood, S; Jimenez-Sandoval, S; Batten, T; Nagyte, V; Yao, Y; Walker, A R H; Ferreira, E H M; Casiraghi, C; Pollard, A J (2022) International interlaboratory comparison of Raman spectroscopic analysis of CVD-grown graphene. 2D Materials, 9 (3). 035010

Clifford, C A; Martins Ferreira, E H; Fujimoto, T; Herrmann, J; Hight Walker, A R; Koltsov, D; Punckt, C; Ren, L; Smallwood, G J; Pollard, A J (2021) The importance of international standards for the graphene community. Nature Reviews Physics, 3 (4). pp. 233-235. ISSN 2522-5820

Bushell, M; Meija, J; Chen, M; Batchelor, W; Browne, C; Cho, J Y; Clifford, C A; Al-Rekabi, Z; Vanderfleet, O M; Cranston, E D; Lawn, M; Coleman, V A; Nyström, G; Arcari, M; Mezzenga, R; Park, B C; Shin, C H; Ren, L; Bu, T; Saito, T; Kaku, Y; Wagner, R; Johnston, L J (2021) Particle size distributions for cellulose nanocrystals measured by atomic force microscopy: an interlaboratory comparison. Cellulose, 28 (3). pp. 1387-1403. ISSN 0969-0239