Pollard, A; Castro, F; Edwards, G; Gee, M; Giannis, S; Kitchen, S; Williams, J (2024) Advanced Materials Metrology Strategy. Other.

Despotelis, K; Pollard, A; Clifford, C; Paton, K (2022) VAMAS TWA 41 - Graphene and related 2D materials project 12 - Distribution of lateral size and thickness of few-layer graphene flakes using SEM and AFM. SEM and AFM measurement protocol. NPL Report. AS 103

Pollard, A; Turner, P (2019) VAMAS TWA 41 - Graphene and Related 2D Materials Project 1 - Structural characterisation of CVD-grown graphene: Coverage on substrate, number of layers, level of disorder: Raman Spectroscopy Measurement Protocol. NPL Report. AS 101

Wang, R; Pearce, R; Gallop, J C; Patel, T; Zhao, F*; Pollard, A; Klein, N*; Jackman, R*; Zurutuza, A*; Hao, L (2016) Investigation of CVD graphene topography and surface electrical properties. Surf. Topogr.: Metrol. Prop., 4 (2). 025001