Publications
Items where Author is "Paciello, V."
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Conference or Workshop Item
Paciello, V.; De Santis, L.; Hutzschenreuter, D.; Smith, I. (2020) A universal metadata model for metrological complex quantities. In: 2020 IEEE International Workshop on Metrology for Industry 4.0 & IOT (METROIND4.0&IOT), 3 - 5 June 2020, Roma, Italy.