We use cookies to ensure that we give you the best experience on our website Learn more
Lee, J L S; Nimomiya, S*; Matsuo, J*; Gilmore, I S; Seah, M P; Shard, A G (2010) Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ions. Anal. Chem., 82 (1). pp. 98-105.