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Shard, A G; Counsell, J D P; Cant, D J H; Smith, E F; Navabpour, P; Zhang, X L; Blomfield, C J (2019) Intensity calibration and sensitivity factors for XPS instruments with monochromatic Ag Lα and Al Kα sources. Surface and Interface Analysis, 51 (7). pp. 763-773. ISSN 0142-2421