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Havelund, R; Licciardello, A*; Bailey, J*; Tuccitto, N*; Sapuppo, D*; Gilmore, I S; Sharp, J S*; Lee, J L S; Mouhib, T*; Delcorte, A* (2013) Improving secondary ion mass spectrometry C60(n+) sputter depth profiling of challenging polymers with nitric oxide gas dosing. Anal. Chem., 85 (10). pp. 5064-5070.