Schodel, R; Yacoot, A; Lewis, A (2021) The new mise en pratique for the metre-a review of approaches for the practical realization of traceable length metrology from 10(-11) m to 10(13) m. Metrologia, 58 (5). 052002

Geckeler, R D; Just, A; Vasilev, V; Prieto, E; Dvorácek, F; Zelenika, S; Przybylska, J; Duta, A; Victorov, I; Pisani, M; Saraiva, F; Salgado, J A; Gao, S; Anusorn, T; Tan, S L; Cox, P; Watanabe, T; Lewis, A; Chaudhary, K P; Thalmann, R; Banreti, E; Nurul, A; Fira, R; Yandayan, T; Chekirda, K; Bergmans, R; Lassila, A (2018) Angle comparison using an autocollimator. Metrologia, 55 (1A). 04001 ISSN 0026-1394

Salgado, J; Duta, A; Lewis, A; Gunn, D; Picotto, G B; Borovsky, J; Nanits, M M; Mudronja, V; Castellanos, C C; Kornbilt, F; Renegar, B; de Souza, M M (2017) Calibration of surface roughness standards. Metrologia, 54 (1A). 04005 ISSN 0026-1394

Lewis, A; Lillepea, L; Matus, M; Prieto, E; Ačko, B; Hansen, M S; Turner, P; Testa, N; Daoud, A; Montassar, C; Švedova, L; Hald, J; Gaidamovičiūtė, L; Bajic, G (2017) Supplementary comparison EURAMET.L-S22, calibration of gauge blocks by mechanical comparison. Metrologia, 54 (1A). 04002 ISSN 0026-1394

Bailey, S L C; Lewis, A; Whiting, K; Lingard, M (2017) Care and use of gauge blocks. Measurement Good Practice Guide. 149

Matus, M*; Piree, H*; Gavalyugov, V*; Tamakyarska, D*; Thalmann, R*; Balling, P*; Garnaes, J*; Hald, J*; Farid, N*; Prieto, E*; Lassila, A*; Salgado, J*; Lewis, A; Bandis, C*; Mudronja, V*; Banreti, E*; Balsamo, A*; Bergmans, R*; Karlsson, H*; Ramotowski, Z*; Saraiva, F*; Eusebio, L*; Duta, A*; Zelenika, S*; Bergstrand, S*; Fira, R*; Yandayan, T*; Sendogdu, D*; Akgoz, S A*; Ganioglu, O*; Haas, S*; Franke, P* (2016) Measurement of gauge blocks by interferometry. Metrologia, 53 (1A). 04003.

Nasr, K M; Hughes, B; Forbes, A B; Lewis, A (2014) Determination of laser tracker angle encoder errors. In: UNSPECIFIED.

Hughes, E B; Forbes, A B; Lewis, A; Sun, W; Veal, D; Nasr, K (2011) Laser tracker error determination using a network measurement. Meas. Sci. Technol., 22 (4). 045103

Hughes, E B; Sun, W; Forbes, A B; Lewis, A (2010) Determining laser tracker alignment errors using a network measurement. J. CMSC, 5 (2). pp. 26-32.

Lewis, A (2008) Uncertainty budget for the NPL-UCL swing arm profilometer operating in comparator mode. NPL Report. ENG 9

Lewis, A; Oldfield, S; Callender, M*; Efstathiou, A*; Gee, A*; King, C*; Walker, D* (2006) Arcuate arm profilometry - traceable metrology for large mirrors. In: Symposium of Metrology 2006, 25-27 October 2006, Mexico.

Leach, R K; Cui, Z*; Lewis, A; Singleton, L* (2004) Standardisation of microsystems technology: completion of the MEMSTAND project. MST News, 1 (Februa). pp. 39-41.

Peggs, G N; Lewis, A; Leach, R K (2003) Measuring in three dimensions at the mesoscopic level. In: Proceedings of the ASPE Winter Topical Meeting - Machines and Processes for Micro-scale and Meso-scale Fabrication, Metrology and Assembly., January 2003, Florida, USA.

Cui, Z*; Leach, R K; Lewis, A; Singleton, L* (2003) Standardisation for microsystems technology: the way forward. In: Proceedings of the 8th International Conference on the Commercialization of Micro and Nano Systems: COMS 2003, 8-11 September 2003, Amsterdam.

Leach, R K; Lewis, A; Singleton, L*; Cui, Z* (2003) Towards a standardisation roadmap for micro-systems technology: review of the MEMSTAND survey. In: Proceedings of euspen "Transferring Micro-systems Technology though the Commercial Markets"., 14-15 April 2003, NPL,UK.

Leach, R K; Haycocks, J; Jackson, K; Lewis, A; Oldfield, S; Yacoot, A (2001) Advances in traceable nanometrology at the National Physical Laboratory. Nanotechnology, 12. pp. R1-R6.

Leach, R K; Haycocks, J; Jackson, K; Lewis, A; Oldfield, S; Yacoot, A (2000) Advances in traceable nanometrology at the National Physical Laboratory. In: Proc. Int. Seminar Future Directions of Nanotechnology in Europe and Japan., 18-19 September 2000, Warwick University.

Lewis, A (1994) Measurement of length, surface form and thermal expansion coefficient of length bars up to 1.5 m using multiple-wavelength phase-stepping interferometry. Meas. Sci. Technol., 5. 694 - 703