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Items where Author is "Langdell, S*"
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Report/Guide
Byng, M*; Langdell, S* (2004) Classification techniques and the application to metrology. NPL Report. CMSC 37/04
Boudjemaa, R; Forbes, A B; Harris, P M; Langdell, S* (2003) Multivariate empirical models and their use in metrology. NPL Report. CMSC 32/03